Информация о книге:
Автор книги: Daniel Chateigner
Жанр: Техническая литература
Издательство: John Wiley & Sons Limited
Год издания: 0
isbn: 9781118622711
Аннотация:
This book introduces and details the key facets of Combined Analysis – an x-ray and/or neutron scattering methodology which combines structural, textural, stress, microstructural, phase, layer, or other relevant variable or property analyses in a single approach. The text starts with basic theories related to diffraction by polycrystals and some of the most common combined analysis instrumental set-ups are detailed. Also discussed are microstructures of powder diffraction profiles; quantitative phase analysis from the Rietveld analysis; residual stress analysis for isotropic and anisotropic materials; specular x-ray reflectivity, and the various associated models.