Olivier Cavalie

Surface Displacement Measurement from Remote Sensing Images


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      SCIENCES

      Image, Field Director – Laure Blanc-Feraud

      Remote Sensing Imagery, Subject Head – Emmanuel Trouvé and Avik Bhattacharya

      Surface Displacement Measurement from Remote Sensing Images

       Coordinated by

      Olivier Cavalié

      Emmanuel Trouvé

      First published 2022 in Great Britain and the United States by ISTE Ltd and John Wiley & Sons, Inc.

      Apart from any fair dealing for the purposes of research or private study, or criticism or review, as permitted under the Copyright, Designs and Patents Act 1988, this publication may only be reproduced, stored or transmitted, in any form or by any means, with the prior permission in writing of the publishers, or in the case of reprographic reproduction in accordance with the terms and licenses issued by the CLA. Enquiries concerning reproduction outside these terms should be sent to the publishers at the undermentioned address:

      ISTE Ltd

      27-37 St George’s Road

      London SW19 4EU

      UK

       www.iste.co.uk

      John Wiley & Sons, Inc.

      111 River Street

      Hoboken, NJ 07030

      USA

       www.wiley.com

      © ISTE Ltd 2022

      The rights of Olivier Cavalié and Emmanuel Trouvé to be identified as the authors of this work have been asserted by them in accordance with the Copyright, Designs and Patents Act 1988.

      Any opinions, findings, and conclusions or recommendations expressed in this material are those of the author(s), contributor(s) or editor(s) and do not necessarily reflect the views of ISTE Group.

      Library of Congress Control Number: 2022934057

      British Library Cataloguing-in-Publication Data

      A CIP record for this book is available from the British Library

      ISBN 978-1-78945-083-5

      ERC code:

      PE6 Computer Science and Informatics

       PE6_11 Machine learning, statistical data processing and applications using signal processing (e.g. speech, image, video)

      PE10 Earth System Science

       PE10_14 Earth observations from space/remote sensing

      Preface

      This book is part of ISTE–Wiley’s SCIENCES series and belongs to the Image field of the Engineering and Systems department. The Image field covers the entire processing chain, from acquisition to interpretation, by analyzing the data provided by various imaging systems. This field is split into seven subjects, including remote sensing imagery (RSI). Based on this subject, we proposed a series of books that would portray diverse and comprehensive topics related to advanced remote sensing images and their applications for Earth observation (EO). There has been an increasing demand for the monitoring and prediction of our planet’s evolution on local, regional and global scales. Hence, airborne, space-borne and ground-based platforms with active and passive sensors have been used to acquire images that measure several features at various spatial and temporal resolutions over the past few decades.

      RSI has become a broad multidisciplinary domain, attracting scientists across the diverse fields of science and engineering. The books proposed in this RSI series aim to present state-of-the-art scientific knowledge about the primary sources of images acquired by optical and radar sensors. The books cover the processing methods that have been developed by the signal and image processing community to extract useful information for end-users for an extensive range of EO applications.

      Each RSI book focuses on a general topic, such as change detection, surface displacement measurement, target detection, model inversion or data assimilation. We dedicate this second book of the RSI series to the measurement of displacements on the Earth’s surface using RSI. It presents the main approaches that are used to derive displacement information from image pairs or image time series using optical and synthetic aperture radar (SAR) data. Following the numerous studies conducted in this domain, we divide this book into methodology and applications.