Joel P. Dunsmore

Handbook of Microwave Component Measurements


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2.4 Example of a VNA source block diagram.

      The swept frequency oscillator is typically phase‐locked to a lower‐frequency fractional‐N (F.N) circuit or direct‐digital synthesizers (DDSs). In older VNAs, the phase locking was accomplished through the reference receiver, which reduced cost but required that the reference path signal remain present for all measurements. Modern analyzers separate the frequency synthesis for sources from receivers for greater flexibility and no longer require the any signal be present in the reference path. Because of this, the RF signal may be pulsed modulated without losing phase lock on the synthesizer.

      The output may also go to multiple stages of division or multiplication, followed by amplification and filtering. The final output signal is combined from each of the input signals, resulting in broad frequency coverage. Typically, this common output has some RF detector on it to provide for ALC loop operation, maintaining constant source power over the different frequency bands and compensating for amplifier flatness. But often the ALC attenuator drive can be operated in an open‐loop mode to extend the power range beyond that of the detector diode.

      The level control circuits often use an amplitude modulator before the amplification chain to complete the ALC loops. In some modern VNAs, a pulse modulator is added as well to provide for high‐speed pulsed RF measurements. When a pulse‐modulator is used inside the ALC loop, the ALC function must be disabled as it will attempt to respond to the pulsed signals. In this open‐loop mode, more sophisticated calibration or digital control must be used to control the source output power. Recently the use of a reference or test receiver as the ALC loop power control, rather than the internal diode detector, has become more common. This form of receiver leveling provides accurate results if the receivers are calibrated, a much wider range of leveling than the diode detector can support, and the ability to be programmatically controlled to correct for any external path loss or to provide a prescribed power profile.

      

       2.2.2 Understanding Source‐Match

      One of the most confusing issues with respect to VNA measurements is the idea of source‐match. Source‐match also affects non‐VNA measurements when signal sources are connected directly to a DUT, but in such cases it is almost always ignored as its affect cannot be determined; but in VNA measurements, the port 1 reflectometer can help to determine the exact effect of mismatch between the source and the DUT and correct for these errors. In fact, there are three different and distinct source attributes that are often confused as the source‐match of a VNA, and each affects different measurements in different ways.

      2.2.2.1 Ratio Source‐Match

Graphs depict the ratio source match such as trace when using a power splitter (upper) and trace when using a directional-coupler (lower).

      When a splitter is used, since the splitter uses equal 50 Ω resistors in most cases, the input match to the splitter (as it appears from the source) is nominally 50 Ω, and the loss through the splitter is about 6 dB. The mathematical process of taking the ratio has the effect of creating a virtual ground at the common node of the splitter, so the ratio source‐match is a measure of the quality of the internal 50 Ω resistor.

      

      2.2.2.2 Power Source‐Match

Schematic illustration of the circuit diagram of simplified diagram of source power match.

      From the test port one sees a series of 50 Ω resistance (of the splitter), behind which is the 50 Ω source impedance in parallel with 100 Ω (50 Ω from the splitter, 50 Ω from the reference receiver, in series), to generate a power match of

      (2.1)equation

      as the Thevenin equivalent impedance. From this it is clear that the for the two‐resistor splitter case, even in an ideal case the power source‐match cannot be Z0.