Jörg Flock

X-Ray Fluorescence Spectroscopy for Laboratory Applications


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Secondary Fuels

      17  11 Analysis of Liquids 11.1 Multielement Analysis of Liquids 11.2 Fuels and Oils 11.3 Trace Analysis in Liquids 11.4 Special Preparation Techniques for Liquid Samples

      18  12 Trace Analysis Using Total Reflection X-Ray Fluorescence 12.1 Special Features of TXRF 12.2 Sample Preparation for TXRF 12.3 Evaluation of the Spectra 12.4 Typical Applications of the TXRF

      19  13 Nonhomogeneous Samples 13.1 Measurement Modes 13.2 Instrument Requirements 13.3 Data Evaluation

      20  14 Coating Analysis 14.1 Analytical Task 14.2 Sample Handling 14.3 Measurement Technology 14.4 The Analysis Examples of Coated Samples

      21  15 Spot Analyses 15.1 Particle Analyses 15.2 Identification of Inclusions 15.3 Material Identification with Handheld Instruments 15.4 Determination of Toxic Elements in Consumer Products: RoHS Monitoring 15.5 Toxic Elements in Toys: Toys Standard

      22  16 Analysis of Element Distributions 16.1 General Remarks 16.2 Measurement Conditions 16.3 Geology 16.4 Electronics 16.5 Archeometric Investigations 16.6 Homogeneity Tests

      23  17 Special Applications of the XRF 17.1 High-Throughput Screening and Combinatorial Analysis 17.2 Chemometric Spectral Evaluation 17.3 High-Resolution Spectroscopy for Speciation Analysis

      24  18 Process Control and Automation 18.1 General Objectives 18.2 Off-Line and At-Line Analysis 18.3 In-Line and On-Line Analysis

      25  19 Quality Management and Validation 19.1 Motivation 19.2 Validation

      26  Appendix A: Tables

      27  Appendix B: Important Information B.1 Coordinates of Main Manufacturers of Instruments and Preparation Tools B.2 Main Suppliers of Standard Materials B.3 Important Websites B.4 Laws and Acts, Which Are Important for X-Ray Fluorescence

      28  References

      29  Index

      30  End User License Agreement

      List of Tables

      1 Chapter 2Table 2.1 Approximate relative line intensities of main X-ray lines.Table 2.2 Comparison of line designations for the main X-ray lines.

      2 Chapter 3Table 3.1 Preparation technologies for solid samples.Table 3.2 Information depth for different fluorescence lines in various mater...Table 3.3 Information depth and accumulated intensity in the case of 10 wt% N...Table 3.4 Estimations of the sample volume and mass that contribute to the me...Table 3.5 Contaminations in the range of traces by preparation tools (main co...Table 3.6 Steps for processing and sampling of small part materials.Table 3.7 Mills for fine grinding of powder-like material.Table 3.8 Binders and additives for pressed pellets.Table 3.9 Flux agents for different applications.Table 3.10 Sample–flux ratios for typical materials in grams (valid for diame...Table 3.11 Window materials for sample cups for liquid samples.

      3 Chapter 4Table 4.1 Comparison of wavelength- and energy-dispersive X-ray spectrometer ...Table 4.2 Often used crystals for wavelength-dispersive spectrometry.Table 4.3 Instrument setup parameters.Table 4.4 Products offered by instrument manufacturers for different instrume...

      4 Chapter 5Table 5.1 Contributions to the Cr intensity by primary, secondary, and tertia...Table 5.2 Relative statistical error as a function of the number of counts.Table 5.3 Substances