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Accelerated Life Testing of One‐shot Devices:
Data Collection And Analysis
Narayanaswamy Balakrishnan
McMaster University
Hamilton, Canada
Man Ho Ling
The Education University of Hong Kong
Tai Po, Hong Kong
Hon Yiu So
University of Waterloo
Waterloo, Canada
This first edition first published 2021
© 2021 by John Wiley and Sons, Inc.
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