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Fundamentals of Terahertz Devices and Applications


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the R and L, we can obtain the equivalent ellipse with the following expressions:

      (2.57)equation

Schematic illustration of synthesis of an elliptical lens from an extended hemispherical lens for silicon, fused silica and PTFE.

      (2.58)equation

      (2.59)equation

      Depending on the dielectric constant, the fitting of the elliptical lens and the extended hemispherical lens varies. Three examples are shown in Figure 2.9 where both lenses of silicon (εr ≈ 11.9), quartz (εr ≈ 4.5) and polytetrafluoroethylene (PTFE) (εr ≈ 2). The rays from a broadside plane wave incident onto the extended semi‐hemispherical lens, as opposed to the elliptical lens, do not come to a point focus, thus, which means that the lens introduces an aberration to the radiated fields. But as we will see in the following sections, even if it does not couple well to a planar equi‐phase front, the extended hemispherical lens will couple well to a Gaussian‐beam system.

      2.3.1 Radiation of Extended Semi‐hemispherical Lenses

      In Section 2.2, we computed the radiation pattern from an elliptical lens antenna by deriving the currents on a planar aperture above the lens and, from them, we obtained the radiated fields from the lens antenna. In this section, we will explain how to compute the radiated fields of the extended hemispherical lens antenna from the currents evaluated on the lens surface. A PO method provides an approximation of these surface currents over a lens of several wavelengths. Using again the Love's Equivalence Principle, the radiated fields from the antenna feed obtained previously are used to compute the equivalent magnetic and electric sheet currents outside of the lens surface:

      (2.60)equation

      (2.61)equation

Geometric representation of sketch of the extended semi-hemispherical lens antenna parameters.

      (2.62)equation

      (2.63)equation

      where the τ and τ are Fresnel transmission coefficients for a dielectric lens of permittivity εr (2.27 and 2.28). This time the incident angle is evaluated using the normal vector corresponding to the hemispherical lens. The propagation vectors of the incident and transmitted fields are defined as follows:

      (2.64)equation

      (2.65)equation

      (2.66)equation

      Once the PO surface currents are evaluated via the transmitted fields, one can obtain the far‐field patterns. Those patterns can be obtained using the reference system shown in Figure 2.8, and integrating the PO surface currents over the lens hemispherical surface, as follows:

      (2.67)equation

      (2.68)equation

Graph depicts the directivity of an elliptical lens and an extended hemispherical lens as a function of the feed illumination.